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Image Sensors for Near Infrared Region

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InGaAs image sensors are designed for a wide range of applications in the near infrared region. Built-in CMOS ROIC readout circuit allows easy signal processing. These image sensors use a charge amplifier mode that provides a large output signal by integrating the charge, making them ideal for low -light-level detection.

Equivalent circuit (InGaAs linear image sensor)

 
Spectral response

G9201 to G9208 series, etc.

 

G12230-512WB

 

 

 

InGaAs linear image sensors for spectrometry

Type no.

Cooling

Pixel
height
(μm)

Pixel pitch
(μm)

Number of
pixels

Line rate
(lines/s)

Spectral
responese range
λ
(μm)

Defective
pixel

Photo

G9203-256D

Non-cooled

500

50

256

1910

0.9 to 1.7

0

G9204-512D

25

512

960

G11608-256DA

50

256

17200

0.5 to 1.7

1% max.

G11608-512DA

25

512

9150

G9211-256S

One-stage TE- cooled (Td=-10 °C)

250

50

256

1910

0.9 to 1.67

1% max.

G9212-512S

25

512

960

G9213-256S

500

50

256

1910

G9214-512S

25

512

960

G9201-256S

250

50

256

1910

0

G9202-512S

25

512

960

G9203-256S

500

50

256

1910

G9204-512S

25

512

960

G9205-256W

Two-stage TE- cooled (Td=-20 °C)

250

50

256

1910

0.9 to 1.85

5% max.

G9206-256W

0.9 to 2.05

G9206-02

0.9 to 2.15

G9207-256W

0.9 to 2.25

G9208-256W

0.9 to 2.55

G9205-512W

25

512

960

0.9 to 1.85

G9206-512W

0.9 to 2.15

G9208-512W

0.9 to 2.55

 

 

High-speed type InGaAs linear image sensors

These are linear image sensors with high-speed data rate designed for industrial measuring instruments.

Type no.

Cooling

Pixel
height
(μm)

Pixel pitch
(μm)

Number of
pixels

Line rate
(lines/s)

Spectral
responese range
λ
(μm)

Defective
pixel

Photo

G9494-256D

Non-cooled

50

50

256

7100

0.9 to 1.7

1% max.

G9494-512D

25

25

512

3720

 
 
The G10768 series is a high-speed infrared image sensor with 1024 pixels designed for applications such as foreign object screening and medical diagnostic equipment where a multichannel high-speed line rate is required.

Type no.

Cooling

Pixel
height
(μm)

Pixel pitch
(μm)

Number of
pixels

Line rate
(lines/s)

Spectral
responese range
λ
(μm)

Defective
pixel

Photo

G10768-1024D

Non-cooled

100

25

1024

39000

0.9 to 1.7

1% max.

G10768-1024DB

25

 
 
 
Back-illuminated type InGaAs linear image sensors
The back-illuminated InGaAs photodiode and CMOS-ROIC are bump bonded to provide a single output terminal.

Type no.

Cooling

Pixel
height
(μm)

Pixel pitch
(μm)

Number of
pixels

Line rate
(lines/s)

Spectral
responese range
λ
(μm)

Defective
pixel

Photo

G11135-256DD

Non-cooled

50

50

256

14000

0.95 to 1.7

1% max.

G11135-512DE

25

25

512

8150

G11620-128DA

500

50

128

30800

G11620-256DA

256

17200

G11620-256DF

25

256

17200

G11620-512DA

512

9150

G11620-256SA

One-stage TE-cooled (Td=-10 °C)

500

50

256

17200

0.95 to 1.67

G11620-512SA

25

512

9150

G12230-512WB

Two-stage TE-cooled (Td=-20 °C)

250

25

254 + 254

9150

0.95 to 2.15

2% max.

 

 

InGaAs area image sensor

The InGaAs area image sensors have a hybrid structure consisting of a CMOS readout circuit (ROIC: readout integrated circuit) and back-illuminated InGaAs photodiodes.

Type no.

Cooling

Pixel
height
(μm)

Pixel pitch
(μm)

Number of
pixels

Line rate
(lines/s)

Spectral
responese range
λ
(μm)

Defective
pixel

Photo

G11097-0606S

One-stage TE-cooled (Td=25 °C)

50

50

64 × 64

1025

0.95 to 1.7

1% max.

G11097-0707S

128 × 128

279

G12460-0606S

One-stage TE-cooled (Td=0 °C)

64 × 64

1025

1.12 to 1.9

G12242-0707W

Two-stage TE-cooled (Td=15 °C)

20

20

128 × 128

258

0.95 to 1.7

1% max.

G13393-0808W

320 × 256

228

0.37% max.

G13393-0909W

640 × 512

62

G13441-01

Two-stage TE-cooled (Td=-20 °C)

50

50

192 × 96

867

1.3 to 2.15

1% max.

 

 

Block diagram (G11097-0606S/-0707S, G12460-0606S)

A sequence of operation of the readout circuit is described below.
In the readout circuit, the charge amplifier output voltage is sampled and held simultaneously at all pixels during the integration time determined by the low period of the master start pulse (MSP) which is as a frame scan signal. Then the pixels are scanned and their video signals are output.
Pixel scanning starts from the starting point at the upper left in the right figure. The vertical shift register scans from top to bottom in the right figure while sequentially selecting each row.
For each pixel on the selected row, the following operations are performed:
① Transfers the sampled and held optical signal information to the signal processing circuit as a signal voltage.
② Resets the amplifier in each pixel after having transferred the signal voltage and transfers the reset voltage to the signal processing circuit.
③ The signal processing circuit samples and holds the signal voltage ① and reset voltage ②.
④ The horizontal shift register scans from left to right in the right figure, and the voltage difference between ① and ② is calculated in the offset compensation circuit. This eliminates the amplifier offset voltage in each pixel.
The voltage difference between ① and ② is output as the output signal in the form of serial data.
The vertical shift register then selects the next row and repeats the operations from ① to ④. After the vertical shift register advances to the 64th row (G11097-0606S, G12460-0606S) or 128th (S11097-0707S), the MSP, which is a frame scan signal, goes low. After that, when the MSP goes high and then low, the reset switches for all pixels are simultaneously released and the next frame integration begins.

 

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